SEMICONDUCTOR TEMPERATURE STRESS TESTING - AN OVERVIEW

Semiconductor Temperature Stress Testing - An Overview

(logic circuits) A Boolean Procedure which can be real once the two input variables are distinctive but is or else Untrue; the XOR Procedure ( A B ¯ + A ¯ B displaystyle scriptstyle A overline B + overline A B " We define the "engraphic result" of the stimulus as the effect in creating a difference between the key and secondary indifference-state

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